X-Ray diffraction (Shimadzu 6000)


The XRD-6000 offers solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state change analysis, including stress analysis, residual austenite quantitation, crystallite size/lattice strain, and crystallinity calculation, materials analysis via overlaid X-ray diffraction patterns, enhanced material evaluation and sample heating analysis. Moreover, of course, crystalline structural analysis is supported, including precise lattice constant determination and crystal system determination.