Atomic Force Microscopy (AFM) WI Tec's (AFM)

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic-resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analysing tip-sample interaction forces.