The JEOL JSM-IT100 is the latest addition to the award-winning InTouch Scope Series of Scanning Electron Microscopes. Representing 50 years of industry and technological leadership, the IT100 is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design. Now with expanded EDS analysis capabilities, the In Touch Scope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. It offers high-resolution imaging and a range of acceleration voltages at both high and low vacuum modes.