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Transmission Electron Microscope / 200 kV TEM / FEG TEM (JEM-2100)

The JEOL JEM-2100 is a compact high-performance TEM ideally suited for a variety of applications in the fields of materials science, nanotechnology and life science. The JEM-2100 includes an extremely stable goniometer stage, which was designed for high tilt angles especially for tomography. With the optional JEOL tomography software TEMography™, image series are acquired automatically, 3-D reconstruction is calculated, and the reconstructed object is displayed with 3-D visualization software. It attached with the following units:

STEM with HAADF, EDS systems